BS IEC 60747-4-2-2000 半导体器件.分立器件.微波二极管和晶体管.集成电路微波放大器.空白详细规范

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【英文标准名称】:Semiconductordevices-Discretedevices-Microwavediodesandtransistors-Integrated-circuitmicrowaveamplifiers-Blankdetailspecification
【原文标准名称】:半导体器件.分立器件.微波二极管和晶体管.集成电路微波放大器.空白详细规范
【标准号】:BSIEC60747-4-2-2000
【标准状态】:作废
【国别】:英国
【发布日期】:2000-07-15
【实施或试行日期】:2000-07-15
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:半导体器件;规范(验收);详细规范;电子设备及元件;验收(鉴定);微波放大器;微波晶体管;放大器;二极管;集成电路
【英文主题词】:Detailspecification;Diodes;Discrete;Electronicequipmentandcomponents;Microwaveamplifiers;Microwavetransistors;Semiconductordevices;Transistors
【摘要】:Semiconductordevices—Discretedevices—Part4-2:Microwavediodesandtransistors—Integrated-circuitmicrowaveamplifiers—Blankdetailspecification1Markingandorderinginformation2Application-relateddescription3Specificationofthefunction4Limitingvalues(absolutemaximumratingsystem)5Operatingconditions(withinthespecifiedoperatingambientorcasetemperaturerange)6Electricalcharacteristics7Programming8Mechanicalandenvironmentalratings,characteristicsanddata9Additionalinformation10Screening11Qualityassessmentprocedures12Structuralsimilarityprocedures13Testconditionsandinspectionrequirements
【中国标准分类号】:L53
【国际标准分类号】:31_080_99
【页数】:22P;A4
【正文语种】:英语